发明名称 |
CHIP DAMAGE DETECTION DEVICE FOR A SEMICONDUCTOR INTEGRATED CIRCUIT |
摘要 |
A chip damage detection device is provided that includes at least one bi-stable circuit having a first conductive line passing through an observed area of a semiconductor integrated circuit chip for damage monitoring of the observed area. The at least one bi-stable circuit is arranged to flip from a first stable state into a second stable state when a potential difference between a first end and a second end of the first conductive line changes or when a leakage current overdrives a state keeping current at the first conductive line. Further, a semiconductor integrated circuit device that includes the chip damage detection device and a safety critical system that includes the semiconductor integrated circuit device or the chip damage detection circuit is provided. |
申请公布号 |
US2012286269(A1) |
申请公布日期 |
2012.11.15 |
申请号 |
US201013522865 |
申请日期 |
2010.01.21 |
申请人 |
HEMON ERWAN;PHILIPPE LANCE;NEUGEBAUER KURT;FREESCALE SEMICONDUCTOR, INC. |
发明人 |
HEMON ERWAN;PHILIPPE LANCE;NEUGEBAUER KURT |
分类号 |
H01L23/544 |
主分类号 |
H01L23/544 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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