发明名称 VERTICAL TYPE SEMICONDUCTOR MEMORY DEVICE, METHOD FOR MANUFACTURING THE SAME AND METHOD FOR OPERATING THE SAME
摘要 PURPOSE: A vertical type semiconductor memory device, a manufacturing method thereof and an operating method thereof are provided to increase a read sensing margin by expanding a memory window. CONSTITUTION: A substrate includes a first impurity region(104). A single crystal semiconductor pattern is formed on the first impurity region of the substrate and has a second impurity region under the upper surface while having a filler shape. A gate insulating layer structure is formed on the sidewall of the single crystal semiconductor pattern and includes a charge storage pattern(121b). A gate electrode(122a) faces the sidewall of the single-crystal semiconductor pattern and has the upper side which is lower than the semiconductor pattern.
申请公布号 KR20100055874(A) 申请公布日期 2010.05.27
申请号 KR20080114765 申请日期 2008.11.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SON, YONG HOON;LEE, JONG WOOK;KANG, JONG HYUK
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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