发明名称
摘要 <P>PROBLEM TO BE SOLVED: To attain a high-speed module inspection with a simplified operation. <P>SOLUTION: A 2nd substrate 20 and a memory card 30 are connected to a 1st substrate 10, and when key data is stored in the memory card 30, transmitted data is read out of a transmitted data storage part, and then, the inspection of the 2nd substrate 20 is performed. When the key data is not stored, but, related data is stored, the inspection of the 2nd substrate 20 is performed based on the related data. When the key data and the related data are not stored, it is determined whether the consistency of the transmitted data and data to be transmitted exists, and when the consistency exists, the inspection of the 2nd substrate 20 is performed based on the transmitted data, on the other hand, when the consistency does not exist, the inspection of the 2nd substrate 20 is performed based on the data to be transmitted. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP4401796(B2) 申请公布日期 2010.01.20
申请号 JP20040022722 申请日期 2004.01.30
申请人 发明人
分类号 G03G21/00 主分类号 G03G21/00
代理机构 代理人
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