发明名称 Methods and apparatus for wire bonding with wire length adjustment in an integrated circuit
摘要 An integrated circuit is wire bonded in a manner such that there is consistent RF performance from integrated circuit package to integrated circuit package. Bond distances within the integrated circuit are measured, each corresponding to a wire bond to be formed. An area under a hypothetical wire bond profile is calculated as a function of the bond distances, a baseline wire length, and a baseline loop height. A wire is bonded across a given one of the bond distances to form a given one of the wire bonds. A wire bond profile for the given wire bond is provided having an area thereunder that is substantially equal to the calculated area.
申请公布号 US2005183265(A1) 申请公布日期 2005.08.25
申请号 US20040787010 申请日期 2004.02.25
申请人 BAMBRIDGE TIMOTHY B.;BOWEN JOHN W.;BRENNAN JOHN M.;FREUND JOSEPH M. 发明人 BAMBRIDGE TIMOTHY B.;BOWEN JOHN W.;BRENNAN JOHN M.;FREUND JOSEPH M.
分类号 H01L23/49;H01L23/66;H01L27/082;H01L27/102;(IPC1-7):H01L27/082 主分类号 H01L23/49
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