发明名称 Mit hoher Dichte integriertes Halbleiterbauelement für hohe Operationsgeschwindigkeiten
摘要 In a semiconductor device including a plurality of semiconductor cells each of which has a diffusion area, a first metal layer, and a connecting portion, the first metal layer overlies whole of the diffusion area while the connecting portion covers almost whole of the diffusion area. The semiconductor device further includes a second metal layer, and first and second power supply lines. The second metal layer has an interconnecting area positioned above the semiconductor cells and an overlapping area overlapping on the first metal layer. Each of the first and the second power supply lines consists of the overlapping area. The semiconductor cells are electrically connected to each other by a third metal layer and the interconnecting area of the second metal layer. <IMAGE>
申请公布号 DE69432946(D1) 申请公布日期 2003.08.21
申请号 DE1994632946 申请日期 1994.09.17
申请人 NEC CORP., TOKIO/TOKYO 发明人 SUZUKI, KAZUMASA
分类号 H01L21/768;H01L21/82;H01L21/822;H01L23/485;H01L23/528;H01L27/04;(IPC1-7):H01L27/092 主分类号 H01L21/768
代理机构 代理人
主权项
地址