发明名称 DRY ETCH APPARATUS FOR ETCHING OXIDE LAYER
摘要 PURPOSE: A dry etch apparatus for etching an oxide layer is provided to make airtight the inside and the outside of a process chamber and prevent generation of particles by using a vespel ring in an etch process of the dry etch apparatus. CONSTITUTION: A baffle(52) is installed on a hole in the inside of an upper plate(50). An upper electrode(54) is installed at a lower portion of the upper plate(50). A vespel ring(56) is installed at a lower end of the upper electrode(54) in order to prevent a leakage of gas by shielding the inside and the outside of a chamber. A confinement ring(58) is installed at the upper plate(50) in order to support the vespel ring(56). A wafer chuck(62) is installed at a lower end of the inside of a dry etch apparatus. A wafer(60) is loaded on an upper surface of the wafer chuck(62).
申请公布号 KR20020081728(A) 申请公布日期 2002.10.30
申请号 KR20010021056 申请日期 2001.04.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HAK PIL
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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