发明名称 |
DRY ETCH APPARATUS FOR ETCHING OXIDE LAYER |
摘要 |
PURPOSE: A dry etch apparatus for etching an oxide layer is provided to make airtight the inside and the outside of a process chamber and prevent generation of particles by using a vespel ring in an etch process of the dry etch apparatus. CONSTITUTION: A baffle(52) is installed on a hole in the inside of an upper plate(50). An upper electrode(54) is installed at a lower portion of the upper plate(50). A vespel ring(56) is installed at a lower end of the upper electrode(54) in order to prevent a leakage of gas by shielding the inside and the outside of a chamber. A confinement ring(58) is installed at the upper plate(50) in order to support the vespel ring(56). A wafer chuck(62) is installed at a lower end of the inside of a dry etch apparatus. A wafer(60) is loaded on an upper surface of the wafer chuck(62).
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申请公布号 |
KR20020081728(A) |
申请公布日期 |
2002.10.30 |
申请号 |
KR20010021056 |
申请日期 |
2001.04.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HAK PIL |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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