发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To improve accuracy in manufacturing of a wiring, while keeping a current density in wiring. SOLUTION: After a wiring forming conductive film is formed on a semiconductor wafer 1, a resist film 12a is formed thereon. With an etching mask of this resist film 12a, the conductive film is etched and thinned to a halfway through in thickness in an isotropic dry-etching step. Then, by switching the etching treatment from isotropic dry etching to anisotropic dry etching, a wiring 11L is formed.
申请公布号 JP2000299378(A) 申请公布日期 2000.10.24
申请号 JP19990107595 申请日期 1999.04.15
申请人 HITACHI LTD;HITACHI ULSI SYSTEMS CO LTD 发明人 MATSUZAKI SAKAE;HIROKAWA TAKESHI;ONO RYOICHI
分类号 H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/768
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