发明名称 Apparatus and method for diagnosis of abnormality in processing equipment
摘要 An apparatus and a method for diagnosing any abnormality in a processing equipment without the necessity of professional knowledge of a user while ensuring enhanced general-purpose usability. In the apparatus, a computer is connected to a programmable logic controller for controlling the operation of a processing equipment which repeats a predetermined sequence of a plurality of steps, while monitoring information from the processing equipment changed in accordance with the operation in the equipment, thereby automatically detecting any abnormal state in the equipment. The computer comprises memory means for previously storing changes of the information of at least one sequence from the processing equipment in its normal operation; and automatic analysis means for acquiring the information from the processing equipment during its halt caused upon occurrence of any abnormality in the equipment, then comparing the acquired information with the information stored previously in the memory means, and executing an analysis of the abnormal state on the basis of the result of such comparison.
申请公布号 US5870693(A) 申请公布日期 1999.02.09
申请号 US19960757921 申请日期 1996.11.27
申请人 SONY DISPLAY DEVICE (SINGAPORE) PTE. LTD. 发明人 SENG, CHIN CHYE;MADENOKOJI, AKIHIDE;SHIBASAKI, TETSURO
分类号 G05B23/02;G06F11/22;(IPC1-7):G01R31/28 主分类号 G05B23/02
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