发明名称 Energy filter with correction of a second-order chromatic aberration
摘要 An imaging symmetrical energy filter (of the OMEGA -type) comprising two pairs of sector magnets (1), (2), (3), (4) for an electron microscope. The second-order chromatic aberration is corrected by arranging the two pairs of sector magnets {(1),(4) and (2),(3)} further apart. This enables suitable arrangement of the coils to generate correction hexapole fields, so that the chromatic error is even completely eliminated. Moreover, correction of the third-order aperture aberration is also possible by constructing the hexapole coil (9) in the symmetry plane also as an octupole coil. Further correction of this third-order aberration is achieved by applying an octupole field (5) directly at the entrance of the first sector magnet (1) and an octupole field (13) directly at the exit of the fourth sector magnet (4).
申请公布号 US5448063(A) 申请公布日期 1995.09.05
申请号 US19940246534 申请日期 1994.05.20
申请人 U.S. PHILIPS CORPORATION 发明人 DE JONG, ALAN F.;BAKKER, JOHAN G.;ROSE, HARALD
分类号 G21K1/093;H01J37/05;H01J49/46;H05H7/04;(IPC1-7):H01J49/46 主分类号 G21K1/093
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