An X-ray fluorescence thickness measuring devise includes a primary X-ray beam collimation and workpiece positioning system that markedly increases the detectable fluorescent X-radiation from diverse specimen calibration standards and workpieces subjected to measurement. The positioning system includes an optical viewing system that provides a video signal image of the specimen surface prior to and during specimen radiation without hazard to the unit operator and independent of the collimator bore selected. A further feature of the measuring device is that it includes a system which assures repetitive and accurate positioning of a selected collimator relative to the axis of the X-ray beam to obtain maximum beam transmission therethrough.
申请公布号
US4860329(A)
申请公布日期
1989.08.22
申请号
US19860832479
申请日期
1986.02.24
申请人
UPA TECHNOLOGY, INC.
发明人
WEISER, MURRAY;SILVERMAN, WILLIAM;LANDAU, ZVI;FINER, PAUL;PINCUS, CARY I.