| 摘要 |
PURPOSE:To test a logic circuit part by adding a flip-flop circuit which is irrelevant to normal operation to a flip-flop circuit which can be put in scan-pass constitution. CONSTITUTION:The extension flip-flop which is irrelevant to the normal operation is connected through a selector 15. When a logic circuit 11 controls the resetting of a flip-flop circuit 12 during a scan-pass test, the output of the logic circuit 11 is put by the selector 15 in the data of the extension flip-flop circuit 13 which is irrelevant to the normal operation. Thus, the output of the logic circuit 13 can be read out during scan-pass operation and a test is taken.
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