发明名称 TEMPERATURE COMPENSATING CIRCUIT FOR SEMICONDUCTOR STRAIN GAGE
摘要 PURPOSE:To enable adjustment of a compensation value on the high and low temperature sides to different values independently and continuously, by connecting two variable resistors in parallel between output terminals of a bridge circuit. CONSTITUTION:This circuit is provided with a bridge circuit 2 containing a semiconductor strain gage, a sensitivity temperature compensating circuit 1 for compensating temperature for the sensitivity by driving the circuit 2, a zero-point temperature compensating circuit 3 which generates a voltage almost equal to the potential of an output terminal of the circuit 2 when the circuit 2 is at a specified temperature. Two variable resistors R35a and R35b are connected in parallel between output terminals (b) and (d) of the circuit 2 and it is so arranged that slide elements of respective resistors R35a and R35b are connected to a connection point (e) of the circuit 3 alternatively through a switch circuit 5 having two switches adapted to make an ON action alternatively according to the variations in the resistances R34a and R34b and the temperature. Thus, positive and negative compensation values can be varied continuously.
申请公布号 JPS62185101(A) 申请公布日期 1987.08.13
申请号 JP19860026024 申请日期 1986.02.10
申请人 TOSHIBA CORP 发明人 MASUDA HISAYOSHI
分类号 G01B7/00;G01B7/16;G01D5/16 主分类号 G01B7/00
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