发明名称 Abscissa calibration jig and abscissa calibration method of laser interference measuring apparatus
摘要 An abscissa calibration jig of a laser interference measuring apparatus, includes: an image projection unit configured to project an image with a marker; a first support mechanism configured to rotatably support the image projection unit around a first rotation axis passing a predetermined rotation center; and a second support mechanism configured to rotatably support the first support mechanism around a second rotation axis crossing the first rotation axis at the rotation center.
申请公布号 US8879068(B2) 申请公布日期 2014.11.04
申请号 US201213554130 申请日期 2012.07.20
申请人 Mitutoyo Corporation 发明人 Hagino Takeshi;Yokoyama Yuichiro;Kuriyama Yutaka
分类号 G01B9/02;G01B11/00 主分类号 G01B9/02
代理机构 Greenblum & Bernstein, P.L.C. 代理人 Greenblum & Bernstein, P.L.C.
主权项 1. An abscissa calibration jig of a laser interference measuring apparatus, comprising: a spherical reflector configured to project an image with a marker, the spherical reflector including a non-reflective region forming the marker in a surface of the spherical reflector; a first support configured to rotatably support the spherical reflector and rotate around a first rotation axis passing a predetermined rotation center of the spherical reflector; and a second support configured to rotatably support the first support and rotate around a second rotation axis crossing the first rotation axis at the rotation center of the spherical reflector, wherein the spherical reflector uses the rotation center as a center of curvature.
地址 Kanagawa JP