发明名称 |
Abscissa calibration jig and abscissa calibration method of laser interference measuring apparatus |
摘要 |
An abscissa calibration jig of a laser interference measuring apparatus, includes: an image projection unit configured to project an image with a marker; a first support mechanism configured to rotatably support the image projection unit around a first rotation axis passing a predetermined rotation center; and a second support mechanism configured to rotatably support the first support mechanism around a second rotation axis crossing the first rotation axis at the rotation center. |
申请公布号 |
US8879068(B2) |
申请公布日期 |
2014.11.04 |
申请号 |
US201213554130 |
申请日期 |
2012.07.20 |
申请人 |
Mitutoyo Corporation |
发明人 |
Hagino Takeshi;Yokoyama Yuichiro;Kuriyama Yutaka |
分类号 |
G01B9/02;G01B11/00 |
主分类号 |
G01B9/02 |
代理机构 |
Greenblum & Bernstein, P.L.C. |
代理人 |
Greenblum & Bernstein, P.L.C. |
主权项 |
1. An abscissa calibration jig of a laser interference measuring apparatus, comprising:
a spherical reflector configured to project an image with a marker, the spherical reflector including a non-reflective region forming the marker in a surface of the spherical reflector; a first support configured to rotatably support the spherical reflector and rotate around a first rotation axis passing a predetermined rotation center of the spherical reflector; and a second support configured to rotatably support the first support and rotate around a second rotation axis crossing the first rotation axis at the rotation center of the spherical reflector, wherein the spherical reflector uses the rotation center as a center of curvature. |
地址 |
Kanagawa JP |