发明名称 |
METHOD OF ETCHING METAL LAYER |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of etching a copper layer while forming a protection layer containing carbon on a mask, with which it is possible to remove the protection layer formed at the time of the etching.SOLUTION: In an embodiment, a method of etching a metal layer is provided which includes the steps of: (a) etching a metal layer of a workpiece through etching based on ion sputtering while forming a protection layer containing carbon on a surface of a mask for the workpiece (step (a)); (b) exposing the workpiece to oxygen plasma after the step of etching the metal layer (step (b)); and (c) exposing the workpiece to hexafluoroacetylacetone after the step of exposing the workpiece to the oxygen plasma (step (c)). |
申请公布号 |
JP2014170894(A) |
申请公布日期 |
2014.09.18 |
申请号 |
JP20130043100 |
申请日期 |
2013.03.05 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
NISHIMURA EIICHI;YAMASHITA FUMIKO;SASA KOYUMI |
分类号 |
H01L21/3065;C23F4/00;H01L21/3205;H01L21/3213;H01L21/768;H01L23/532 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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