发明名称 METHOD OF ETCHING METAL LAYER
摘要 PROBLEM TO BE SOLVED: To provide a method of etching a copper layer while forming a protection layer containing carbon on a mask, with which it is possible to remove the protection layer formed at the time of the etching.SOLUTION: In an embodiment, a method of etching a metal layer is provided which includes the steps of: (a) etching a metal layer of a workpiece through etching based on ion sputtering while forming a protection layer containing carbon on a surface of a mask for the workpiece (step (a)); (b) exposing the workpiece to oxygen plasma after the step of etching the metal layer (step (b)); and (c) exposing the workpiece to hexafluoroacetylacetone after the step of exposing the workpiece to the oxygen plasma (step (c)).
申请公布号 JP2014170894(A) 申请公布日期 2014.09.18
申请号 JP20130043100 申请日期 2013.03.05
申请人 TOKYO ELECTRON LTD 发明人 NISHIMURA EIICHI;YAMASHITA FUMIKO;SASA KOYUMI
分类号 H01L21/3065;C23F4/00;H01L21/3205;H01L21/3213;H01L21/768;H01L23/532 主分类号 H01L21/3065
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