| 摘要 |
An IC socket for testing an IC package is provided including a socket body ( 10 ), a press cover ( 14 ) preferably pivotally mounted to a first longitudinal end ( 101 ) of the socket body so as to be rotatable with respect to the socket body, and a press member ( 12 ) disposed between the socket body and the press cover to have an end thereof ( 121 ) essentially pivotally mounted to the press cover at a position adjacent the first longitudinal end of the socket body. Thus, by providing the mounting of the press member to the press cover at such a position, a latching member ( 141 ) detachably attached to the press cover will be less damaged in comparison with the conventional IC socket.
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