发明名称 THICKNESS DISTRIBUTION CONTROL FOR ELECTROPLATING
摘要 <p>The invention is directed to an assembly for electroplating comprising an electroplating bath and non-conductive plates. The invention is also directed to an assembly for electroplating comprising an electroplating bath, elements with electrically adjustable resistance, and ampere-hour meters. The invention is further directed to methods for monitoring, controlling and adjusting the thickness distribution of an electroplated material on an object. The object can be of any shape as long as it can electrically charged.</p>
申请公布号 WO2007082275(A2) 申请公布日期 2007.07.19
申请号 WO2007US60408 申请日期 2007.01.11
申请人 SIPIX IMAGING, INC.;KANG, GARY;CHAUG, YI-SHUNG 发明人 KANG, GARY;CHAUG, YI-SHUNG
分类号 C25B9/00;C25D21/12 主分类号 C25B9/00
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