发明名称 |
Method of utilizing fast chip erase to screen endurance rejects |
摘要 |
A method of utilizing Fast Chip Erase to screen endurance rejects. Multiple sectors in a device are selected and a time necessary to program all cells in the sectors is monitored and if the monitored time exceeds a first time, the device fails. A time necessary to erase all the cells without any overerased cells is monitored and if the time exceeds a second time, the device fails. A time necessary to correct overerased cells is monitored and if the time exceeds a third time, the device fails. The total time from erase until overerase correction is achieved is monitored and if the total time exceeds a fourth time, the device fails. The total time to determine erasability is monitored and if this time exceeds a fifth time, the device fails.
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申请公布号 |
US6381550(B1) |
申请公布日期 |
2002.04.30 |
申请号 |
US19990322195 |
申请日期 |
1999.05.28 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
HSIA EDWARD;BANH PHUONG K.;HAMILTON DARLENE |
分类号 |
G11C16/34;G11C29/50;(IPC1-7):G01N37/00 |
主分类号 |
G11C16/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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