首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
IMPROVEMENT OF TOLERANCE TO A XENOGRAFT
摘要
申请公布号
EP1140153(A2)
申请公布日期
2001.10.10
申请号
EP19990963632
申请日期
1999.12.17
申请人
ML LABORATORIES PLC
发明人
LECHLER, ROBERT, IAN;ROGERS, NICHOLA, JANE;DORLING, ANTHONY
分类号
C12N15/09;A61K39/00;A61P37/06;C07K14/705;C07K16/28;C12P21/08;(IPC1-7):A61K39/00;A61K39/395;G01N33/577;G01N33/68
主分类号
C12N15/09
代理机构
代理人
主权项
地址
您可能感兴趣的专利
HANDSFREE DEVICE
PHOTOGRAPHY TAKING APPARATUS AND DEVICE AND METHOD FOR CORRECTING SHADING
VEHICLE-MOUNTED COMMUNICATION DEVICE
ACOUSTIC LOAD DEVICE
CONFERENCE VIDEO IMAGE PROCESSING APPARATUS, AND CONFERENCE VIDEO IMAGE PROCESSING METHOD AND PROGRAM
SUBSTRATE PROCESSING METHOD AND APPARATUS
HIGH-VOLTAGE OPERATION FIELD EFFECT TRANSISTOR, ITS BIAS CIRCUIT AND ITS HIGH-VOLTAGE CIRCUIT
HIGH-VOLTAGE OPERATION FIELD EFFECT TRANSISTOR, ITS BIAS CIRCUIT AND ITS HIGH-VOLTAGE CIRCUIT
METHOD FOR DETERMINING LEAKAGE CURRENT OF DIELECTRIC BASED ON CONDUCTANCE-VOLTAGE(GV)
OPTICALLY TRANSPARENT ANTINOISE FORMED BODY FOR IMAGE DISPLAY DEVICE
METHOD FOR MANUFACTURING WIRING BOARD
BONDING APPARATUS
MANUFACTURING METHOD FOR SEMICONDUCTOR
TRANSFERRING METHOD OF SEMICONDUCTOR SUBSTRATE AND TRANSFER DEVICE
YIELD ANALYZER AND YIELD ANALYTICAL METHOD
SOLID-STATE IMAGING DEVICE AND PORTABLE TELEPHONE WITH PICTURE PROCESSING FUNCTION
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
ELECTRON BEAM DEVICE
NANOWIRE AND ITS MANUFACTURING METHOD, SEMICONDUCTOR DEVICE
RECORDING METHOD OF MAGNETIC RECORDING ELEMENT AND MAGNETIC RECORDING ELEMENT ARRAY