发明名称 Variable delay circuit, testing apparatus, and electronic device
摘要 Provided is a variable delay circuit outputting an output signal delayed with respect to an input signal by a designated delay time, including: a delay controller outputting a control voltage according to the delay time; a MOS transistor receiving the control voltage at a gate, and outputs a drain current according to the control voltage; a correction section connected in parallel to a source and a drain of the current controlling MOS transistor, and outputs a correction current on a monotonic decrease as the drain current increases in a range larger than a predetermined boundary current within a normal usage range of the drain current; and a delay element running an output current resulting from adding the correction current to the drain current, between the delay element and an output terminal of the variable delay circuit, in changing a signal value of the output signal according to the input signal.
申请公布号 US7755407(B2) 申请公布日期 2010.07.13
申请号 US20080233616 申请日期 2008.09.19
申请人 ADVANTEST CORPORATION 发明人 HASUMI TAKUYA;SUDA MASAKATSU;SUDOU SATOSHI
分类号 H03H11/26 主分类号 H03H11/26
代理机构 代理人
主权项
地址