| 摘要 |
This atomic force microscope has a probe (12) for surface analysis of a sample (E), comprising a support body (20) and an elastically deformable cantilever (22) linked to the body (20), the cantilever being provided with a tip (24) designed to come into contact with the sample (E) to be analysed. The microscope also has a mechanism (16) for relative displacement of the analysis probe (12) with respect to the surface of the sample (E), a detector (50, 52) for determining the position of the cantilever (22), and means for vibrating the cantilever (22). These means for vibrating the cantilever have, on the cantilever (22), means (26A, 26B) for conduction of electricity along a continuous path forming a loop (27), these electrical-conduction means (26A, 26B) being secured to the cantilever (22), the support body (20) being provided with two divided conductive sections (30A, 30B) extending the loop (27). The vibration means also have an alternating-current generator (34) connected to the divided conductive sections (30A, 30B) of the analysis probe (12), and a magnetic-field source (18) designed to set up a magnetic field <o>B</o> in the region of the cantilever (22) of the analysis probe (12).
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