发明名称 FUNCTIONAL TEST ASSISTANCE SYSTEM, FUNCTIONAL TEST ASSITING METHOD AND HARDWARE DESCRIPTION MODEL
摘要 PROBLEM TO BE SOLVED: To provide a functional test assistance system to realize mechanical and reliable confirmation of the presence/absence of a test for each test item by execution of simulation. SOLUTION: In description of a designing object circuit by a IEEE standard hardware description language VHDL to be stored in a function description language storage part 11, a statement to output, by a message, a fact that the test item is tested by a procedure stored in a package storage part 12 is embedded and the message is stored in a message storage part 14 by executing a simulation by a functional simulation executing part 13. A report output part 16 judges whether all test items are tested for every test from information indicating correspondence between the message to be stored in the message storage part 14, a test vector name to be stored in a test information storage part 15 and the test item to be tested by them and outputs its result by a report.
申请公布号 JP2001101255(A) 申请公布日期 2001.04.13
申请号 JP19990281836 申请日期 1999.10.01
申请人 TOSHIBA CORP 发明人 KUROSAWA YUICHI;OKAMOTO NAOHIKO;NISHIDE KOICHI;MATOBA TSUKASA
分类号 G01R31/28;G06F11/00;G06F11/22;G06F17/50 主分类号 G01R31/28
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