| 摘要 |
The terminal contact beams of a test or burn-in socket are provided with an abrasive surface to remove oxides or other films from the contact pins, lands, etc., of an electronic device package. The burn-in or test socket is in the form of a housing which holds the electronic device package by its terminal feet to prevent damage to the device package or mis-alignment of the terminal feet and moves the feet with respect to the terminal contact beams to assure good electrical connection therebetween.
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