发明名称 Method of dicing semiconductor wafer with diamond and resin blades
摘要 A method of dicing a semiconductor wafer for dividing a semiconductor wafer having a large number of devices formed thereon in a matrix into a large number of chips by the use of a diamond blade, includes the steps of first cutting by the use of the diamond blade in such a manner as to leave a partial residual portion or portions in a direction of thickness of the wafer and to define a plurality of grooves on the wafer in transverse and longitudinal directions, and then cutting the wafer along the grooves by the use of a resin blade having a width equal to or smaller than that of the diamond blade while a feed speed thereof is kept lower than that of the diamond blade.
申请公布号 US5266528(A) 申请公布日期 1993.11.30
申请号 US19920942235 申请日期 1992.09.09
申请人 FUJITSU LIMITED 发明人 YAMADA, YUTAKA
分类号 H01L21/301;B28D5/02;H01L21/78;(IPC1-7):H01L21/302;H01L21/304;H01L21/463 主分类号 H01L21/301
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