首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
ELECTRONIC PRICE SCALE
摘要
申请公布号
JPH0579891(A)
申请公布日期
1993.03.30
申请号
JP19910241384
申请日期
1991.09.20
申请人
TOKYO ELECTRIC CO LTD
发明人
TAGASHIRA NOBUNAO;USHIJIMA KOSUKE
分类号
G01G19/414;G01G19/415;G01G23/37
主分类号
G01G19/414
代理机构
代理人
主权项
地址
您可能感兴趣的专利
PATTERNED THIN FOIL
MOS VARACTORS AND SEMICONDUCTOR INTEGRATED DEVICES INCLUDING THE SAME
SEMICONDUCTOR FIN FET DEVICE WITH EPITAXIAL SOURCE/DRAIN
III-NITRIDE SEMICONDUCTOR STRUCTURES COMPRISING MULTIPLE SPATIALLY PATTERNED IMPLANTED SPECIES
PARASITIC CHANNEL MITIGATION USING ELEMENTAL DIBORIDE DIFFUSION BARRIER REGIONS
SUPPORT FOR LONG CHANNEL LENGTH NANOWIRE TRANSISTORS
CAPACITOR AND A SEMICONDUCTOR DEVICE INCLUDING THE SAME
MULTILAYER CROWN-SHAPED MIM CAPACITOR AND MANUFACTURING METHOD THEREOF
DEEP TRENCH ISOLATION STRUCTURE IN IMAGE SENSOR DEVICE
SEMICONDUCTOR MEMORY DEVICE
METHOD OF FORMING SEMICONDUCTOR DEVICE INCLUDING EDGE CHIP AND RELATED DEVICE
MICROELECTRONIC PACKAGE WITH HORIZONTAL AND VERTICAL INTERCONNECTIONS
SEMICONDUCTOR DEVICE ALLOWING METAL LAYER ROUTING FORMED DIRECTLY UNDER METAL PAD
APPARATUS AND METHOD FOR PLACING STRESSORS WITHIN AN INTEGRATED CIRCUIT DEVICE TO MANAGE ELECTROMIGRATION FAILURES
MEMORY STRUCTURE
MICROWAVE PROBE, PLASMA MONITORING SYSTEM INCLUDING THE MICROWAVE PROBE, AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE USING THE SYSTEM
CMOS DEVICE WITH DECREASED LEAKAGE CURRENT AND METHOD MAKING SAME
SEMICONDUCTOR CHIP PACKAGE AND METHOD OF MANUFACTURING THE SAME
CHUCK ASSEMBLY WITH TILTABLE CHUCK AND SEMICONDUCTOR FABRICATION SYSTEM INCLUDING THE SAME
TABLE DEVICE, MEASURING DEVICE, MACHINE TOOL, AND SEMICONDUCTOR MANUFACTURING DEVICE
