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发明名称
TEST SIGNAL GENERATION CIRCUIT FOR LSI
摘要
申请公布号
JPH01126572(A)
申请公布日期
1989.05.18
申请号
JP19870286145
申请日期
1987.11.11
申请人
NEC CORP
发明人
ISHIKAWA YUTAKA
分类号
G01R31/3183;G01R31/28;G11C29/00;G11C29/14
主分类号
G01R31/3183
代理机构
代理人
主权项
地址
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