发明名称 |
Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus |
摘要 |
A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an X-ray diffraction apparatus previously limited to the analysis of much larger samples.
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申请公布号 |
US4641329(A) |
申请公布日期 |
1987.02.03 |
申请号 |
US19850726562 |
申请日期 |
1985.04.23 |
申请人 |
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE UNITED STATES DEPARTMENT OF ENERGY |
发明人 |
GREEN, LANNY A.;HECK, JR., JOAQUIM L. |
分类号 |
G01N23/20;(IPC1-7):G01N23/20 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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