发明名称 INSPECTING DEVICE FOR CONDUCTIVE FILM
摘要 PURPOSE:To achieve a higher measuring accuracy, by providing a data processing means which moves a conductive film to perform a temperature correction for the area resistance measured based on signals from an eddy current detector and a temperature detector. CONSTITUTION:A conductive film 3 wound on a winding roll 5 is wound on a winding roll 6 being supported with a transfer roll 4. As eddy current of the conductive film 3 is almost proportional to the area resistance, the area resistance can be measured from an output signal of an eddy current detector 1. But the eddy current detector 1 is so susceptible to the effect of ambient temperature that the relationship varies between the output signal of the eddy current detector 1 and the area resistance with variations in the ambient temperature. So, the temperature near the eddy current detector 1 is measured with a temperature detector 14 and based on a signal from the temperature detector 14, a temperature correction is done for the output signal of the eddy current detector 1 at a data processing section to cancel the effect of the temperature on the area resistance measured thereby improving the measuring accuracy.
申请公布号 JPS61120961(A) 申请公布日期 1986.06.09
申请号 JP19840242521 申请日期 1984.11.19
申请人 TEIJIN LTD 发明人 YAMAUCHI TETSUO;SHINGUU AKIRA
分类号 G01R27/02;G01N27/04;G01N27/72 主分类号 G01R27/02
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